8 results
Simplifying Electron Beam Channeling in Scanning Transmission Electron Microscopy (STEM)
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 4 / August 2017
- Published online by Cambridge University Press:
- 04 July 2017, pp. 794-808
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- August 2017
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Simplifying Electron Beam Channeling in STEM
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 410-411
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- July 2017
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Challenges of Oversimplifying Z-contrast in Atomic Resolution ADF-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 946-947
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- July 2016
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Structural Rearrangement of 2-D Zeolite Nanosheets under Electron Beam
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 1323-1324
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- August 2015
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Channeling of Aberration-corrected STEM Probes at the “Sub-atomic” Scale
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 146-147
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- August 2014
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Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1796-1797
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- August 2014
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Interfaces and Defects in Hybrid Molecular Beam Epitaxy Grown NdTiO3/SrTiO3 Heterostructures
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 98-99
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- August 2014
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Identifying Hexagonal Boron Nitride Monolayers by Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 3 / June 2012
- Published online by Cambridge University Press:
- 12 April 2012, pp. 558-567
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- June 2012
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